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This document defines common tests characterising the EMC behaviour of integrated circuits (ICs) in terms of RF emission and RF immunity in the frequency range from 150 kHz up to 3 GHz as well as pulse immunity and system level ESD, based on international standards for integrated circuits and related standards for IC applications. It contains all information to evaluate any kind of ICs in the same way. In this document general information and definitions of IC types, pin types, test and measurement networks, pin selection, operation modes and limit classes are given. This allows the user to create an EMC specification for a dedicated IC as well as to provide comparable results for comparable ICs.
The Revision 2.1 of the Generic IC EMC Test Specification is an extension of the previous version with new and updated test methods and test definitions. It now describes RF immunity and emission test up to 3GHz as well as transient pulse and unpowered system level ESD tests for integrated circuits.
The guide is only available in English.